Reliable material characterization at low x-ray energy through the phase-attenuation duality

نویسندگان

چکیده

We present a comparison of between two polychromatic x-ray imaging techniques used to characterize materials: dual energy (DE) attenuation and phase-attenuation (PA), the latter being implemented via scanning-based Edge Illumination system. The system-independent method extract electron density effective atomic number developed by Azevedo et al. IEEE Trans. Nucl. Sci. 63, 341 (2016)—SIRZ—is employed for analysis planar images, with same methodology both approaches. show PA be more reliable at low spectra (40 kVp), where conventional DE breaks down due insufficient separation energies in measurements, produce results comparable “standard” high (120 therefore, offering valuable alternative applications use is impractical.

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ژورنال

عنوان ژورنال: Applied Physics Letters

سال: 2022

ISSN: ['1520-8842', '0003-6951', '1077-3118']

DOI: https://doi.org/10.1063/5.0085506